发明名称 METHOD OF MEASURING LENS ABERRATIONS
摘要 <P>PROBLEM TO BE SOLVED: To provide a method of measuring lens aberrations, dispensing with inclination adjusting work to make an optical axis of an interferometer coincide with a lens optical axis, and shortening the total measurement time. Ž<P>SOLUTION: This method of measuring lens aberration using an interferometer includes a step (a3) for measuring (a2) the inclination of a lens, relative to the optical axis of the interferometer to calculate aberration Wt caused by the inclination; a step (a4) for measuring aberration Wp of the lens in an inclined state by using the interferometer;, and a step (a5) for calculating aberration Wo specific to the lens by removing the aberration Wt from the measured aberrations Wp. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010169471(A) 申请公布日期 2010.08.05
申请号 JP20090010955 申请日期 2009.01.21
申请人 KONICA MINOLTA OPTO INC 发明人 OKITSU MASAHIRO;YOSHIDA SHUNICHIRO
分类号 G01M11/02;G01M11/00 主分类号 G01M11/02
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