发明名称 |
METHOD AND ARRANGEMENT FOR UNAFFECTED MATERIAL ANALYSE |
摘要 |
This invention concerns a method for the unaffected material analyse for detection and analysis of at least one material deviation in a material 2. The method is characterised by the detection of a region 1 with a difference in hardness in the material 2 through the use of a tactile sensor 4 that is placed in contact with the material, illumination of the detected area with chromatographic light A in order to obtain reflected light B in the form of a light spectrum, and analysis of the obtained light spectrum in order to obtain information concerning the physical and chemical molecular structure of the material. The invention concerns also an arrangement.
|
申请公布号 |
US2010198025(A1) |
申请公布日期 |
2010.08.05 |
申请号 |
US20080733810 |
申请日期 |
2008.09.11 |
申请人 |
LINDAHL OLOF;RAMSER KERSTIN |
发明人 |
LINDAHL OLOF;RAMSER KERSTIN |
分类号 |
A61B5/00 |
主分类号 |
A61B5/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|