发明名称 |
METHODS AND SYSTEM FOR EXTERNAL CALIBRATION AND CORRECTION OF THE DIFFRACTION ANGLE THETA OF AN X-RAY DIFFRACTION IMAGING SYSTEM USING A STANDARD REFERENCE MATERIAL LIKE POLYETHYLENE, SODIUM CHLORIDE OR ALUMINIUM |
摘要 |
A method for calibrating a detection system including a multi-focus X-ray source includes performing a scan of a calibration material using the detection system to acquire scan data, determining a diffraction profile of the calibration material using the scan data, deriving an actual scatter angle using the determined diffraction profile, deriving an offset angle using the determined actual scatter angle, storing the derived offset angle, and generating a table including the stored offset angle. |
申请公布号 |
WO2010059784(A3) |
申请公布日期 |
2010.08.05 |
申请号 |
WO2009US65081 |
申请日期 |
2009.11.19 |
申请人 |
MORPHO DETECTION, INC.;HARDING, GEOFFREY |
发明人 |
HARDING, GEOFFREY |
分类号 |
G01N23/04;G01N23/20;G01T1/29;G01V5/00 |
主分类号 |
G01N23/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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