发明名称 SEMICONDUCTOR MEMORY DEVICE AND SELF-TEST METHOD OF THE SAME
摘要 A semiconductor memory device includes a main memory includes a nonvolatile memory, and a buffer which stores input/output data of the nonvolatile memory, a buffer unit of the main memory, the buffer unit includes a volatile memory, a self-test interface includes a data input/output pin, and a controller which controls the main memory and the buffer unit. The controller at least stores data in the buffer from the self-test interface via the data input/output pin.
申请公布号 US2010195396(A1) 申请公布日期 2010.08.05
申请号 US20100698576 申请日期 2010.02.02
申请人 HIGUCHI TSUTOMU 发明人 HIGUCHI TSUTOMU
分类号 G11C16/02;G11C7/10;G11C29/00 主分类号 G11C16/02
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