| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device test apparatus which performs a test on a device under test which outputs a reference clock for use in data delivery synchronously with data reading with high precision. SOLUTION: A data input/output signal DQ and the reference clock (a data strobe signal DQS) are output from the device under test 200. In a pin electronics 102a within the semiconductor device test apparatus 100, the reading of the data input/output signal DQ is performed by a comparator 171. As a strobe signal 183a on reading, either a strobe signal 182a which is in sync with the rising edge or falling edge of the reference clock (the data strobe signal DQS) or a strobe signal 114b of which the occurrence time is determined by a user can be selected by a selector 183. COPYRIGHT: (C)2010,JPO&INPIT |
