| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an ultrasonic measuring device capable of accurately and stably extracting information on internal defects with improved reproducibility for imaging clearly when a plurality of reflection signals approach mutually in a time domain and waveforms interfere mutually. Ž<P>SOLUTION: The ultrasonic measuring device scans the surface of a specimen 15 with an ultrasonic probe 16, transmits ultrasonic waves U1 from the ultrasonic probe to the specimen, receives reflection echoes U2 returning from the specimen, and processes reception waveform data generated from the reflection echoes by an arithmetic processing means (waveform arithmetic processing program 37), so that the internal defects 51 of the specimen are inspected. The arithmetic processing means includes a waveform feature extraction means for making reception waveform data where a plurality of reflection echoes interfere mutually undergo wavelet conversion processing for extracting waveform features of the internal defects for imaging. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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