发明名称 In-Situ Formed Capping Layer in MTJ Devices
摘要 A method of forming an integrated circuit includes forming magnetic tunnel junction (MTJ) layers; etching the MTJ layers to form a MTJ cell; and forming a dielectric capping layer on sidewalls of the MTJ cell, wherein the step of forming the dielectric capping layer is in-situ performed with the step of etching the MTJ layers.
申请公布号 US2010193891(A1) 申请公布日期 2010.08.05
申请号 US20100756743 申请日期 2010.04.08
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 WANG YUNG-HUNG;WANG YU-JEN;JUANG MARK;TSAI CHIA-SHIUNG
分类号 H01L29/82 主分类号 H01L29/82
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