发明名称 METHOD AND APPARATUS FOR EXPOSURE, AND METHOD FOR MANUFACTURING DEVICE
摘要 <P>PROBLEM TO BE SOLVED: To efficiently control a rotationally asymmetric component in imaging characteristics in the case where the light amount distribution of exposure light transmitting at least some of optical members of a reticle and a projection optical system is rotationally asymmetric. <P>SOLUTION: In a method for exposure including irradiating a reticle having a transferring pattern formed thereon with exposure light, and exposing a wafer to the exposure light through the reticle and a projection optical system, before at least a part of the surface of a lens 32 of the projection optical system is irradiated with non-exposure light LBA to LBH having a wavelength region different from that of the exposure light, the light amount of the non-exposure light is monitored, and the irradiation amount of the non-exposure light on the at least a part of the surface of the lens 32 is controlled based on the monitoring result. <P>COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010171447(A) 申请公布日期 2010.08.05
申请号 JP20100076427 申请日期 2010.03.29
申请人 NIKON CORP 发明人 UEHARA YUSAKU
分类号 H01L21/027;G02B7/02;G02B13/14;G02B13/18;G02B13/24;G03F7/20 主分类号 H01L21/027
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