发明名称 PLASMA ETCHING APPARATUS, PLASMA ETCHING METHOD AND STORAGE MEDIUM
摘要 PURPOSE: A plasma etching method, a plasma etching device, and a storage medium are provided to form a hole with a high aspect ratio by etching a layer with a high etching rate. CONSTITUTION: A hole is formed on an object layer with a plasma etching. In a first condition, plasma is generated in a process container by turning on a high frequency power applying unit for generating plasma and a negative DC voltage is applied to a top electrode(34) from a DC source(50). In a second condition, the plasma is eliminated in the process container by turning off the high frequency power applying unit for generating plasma and a negative DC voltage is applied to the top electrode from the DC source. A positive charge is neutralized in the hole by supplying a negative ion by a current voltage.
申请公布号 KR20100087266(A) 申请公布日期 2010.08.04
申请号 KR20100006725 申请日期 2010.01.26
申请人 TOKYO ELECTRON LIMITED 发明人 YATSUDA KOICHI;OOYA YOSHINOBU;OKAMOTO SHIN;MOCHIKI HIROMASA
分类号 H01L21/3065 主分类号 H01L21/3065
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