发明名称 Patterning method and field effect transistors
摘要 A patterning method with a filling material with a T-shaped cross section is used as a mask during patterning to produce structures having sublithographic dimensions, such as a double-fin field effect transistor.
申请公布号 US7767100(B2) 申请公布日期 2010.08.03
申请号 US20040575916 申请日期 2004.09.28
申请人 INFINEON TECHNOLOGIES AG 发明人 FEHLHABER RODGER;TEWS HELMUT
分类号 C25F3/00;H01L21/033;H01L21/302;H01L21/308;H01L21/336;H01L21/461;H01L29/423;H01L29/786 主分类号 C25F3/00
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