发明名称 Method for aberration evaluation in a projection system
摘要 Aberrations in an optical system can be detected and measured using a method comprised of a test target in the object plane of a projection system and imaging onto the image plane with the system. The test target comprises at least one open figure which comprises a multiple component array of phase zones, where the multiple zones are arranged within the open figure so that their response to lens aberration is interrelated and the zones respond uniquely to specific aberrations depending on their location within the figure. This is a unique and new method of detecting a variety of aberration types including coma, spherical, astigmatism, and three-point through the imaging onto photosensitive material or image detector placed in the image plane of the system and the evaluation of these images. The method of the invention offers an advantage over other methods because of the sensitivity to particular aberration types, the unique response of the multiple zones of the test target to aberrations, and the ease with which aberrations can be distinguished.
申请公布号 US7768648(B2) 申请公布日期 2010.08.03
申请号 US20060559454 申请日期 2006.11.14
申请人 SMITH BRUCE W 发明人 SMITH BRUCE W.
分类号 G01N21/55;G03B27/68;G03F7/20 主分类号 G01N21/55
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