发明名称 Dummy vias for damascene process
摘要 A method of making an integrated circuit includes providing a low-k dielectric layer on a substrate, the low-k dielectric layer including or adjacent to a plurality of conductive features; patterning the low-k dielectric layer to form trenches; patterning the low-k dielectric layer to form conductive vias and dummy vias, wherein each of the conductive vias is aligned with at least one of the plurality of the conductive features and at least one of the trenches, and each of the dummy vias is a distance above the plurality of conductive features; filling the trenches, conductive vias, and dummy vias using one or more conductive materials; and planarizing the conductive material(s).
申请公布号 US7767570(B2) 申请公布日期 2010.08.03
申请号 US20060457032 申请日期 2006.07.12
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHEN KUEI SHUN;LIN CHIN-HSIANG;CHANG VENCENT;LIN LAWRENCE;WEN LAI CHIEN;CHEN JHUN HUA
分类号 H01L21/00 主分类号 H01L21/00
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