发明名称 Contact lithography apparatus and method
摘要 A contact lithography apparatus and a method use one or both of spacers and a mesa to facilitate pattern transfer. The apparatus and the method include one or both of a spacer that provides a spaced apart orientation of lithographic elements, such as a patterning tool and a substrate, when in mutual contact with the spacer and a mesa between the patterning tool and the substrate. The mesa supports a contact surface of one or both of the mold and the substrate. One or both of the spacers and the mesa may be non-uniform. One or more of the patterning tool, the substrate and the spacer is deformable, such that deformation thereof facilitates the pattern transfer.
申请公布号 US7768628(B2) 申请公布日期 2010.08.03
申请号 US20060548823 申请日期 2006.10.12
申请人 HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. 发明人 WU WEI;WANG SHIH-YUAN;STEWART DUNCAN R.;WILLIAMS R. STANLEY;YU ZHAONING;PARK INKYU
分类号 G03B27/02;G03B27/20;G03B27/22;G03B27/42;G03B27/58;H01L21/00 主分类号 G03B27/02
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