发明名称 |
Method and apparatus for providing a truncated profile probe for perpendicular recording |
摘要 |
The present invention is a truncated probe for a perpendicular recording write head. The truncated probe is formed in a resist using a pullback process. In the pullback process, a trench is formed in the resist. The resist is then heated to a required temperature for a predetermined duration of time. By controlling the temperature and time, the amount of pullback of the resist is controlled to form a specified angle for the truncated probe. Further, the present invention increases the efficiency of the write head by reducing the distance between the air-bearing surface (ABS) and a magnetic back gap of the perpendicular recording write head yokes. This reduction reduces the length of the write head and permits a faster rise time of a recorded signal.
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申请公布号 |
US7768742(B2) |
申请公布日期 |
2010.08.03 |
申请号 |
US20030430949 |
申请日期 |
2003.05.07 |
申请人 |
HITACHI GLOBAL STORAGE TECHNOLOGIES NETHERLANDS B.V. |
发明人 |
GIORGIS BINYAM A.;SANTINI HUGO A. E. |
分类号 |
G11B5/187;G11B5/31;G11B5/127 |
主分类号 |
G11B5/187 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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