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发明名称
SEMICONDUCTOR DEVICE TEST CONTACTOR
摘要
申请公布号
KR100973413(B1)
申请公布日期
2010.08.03
申请号
KR20080087267
申请日期
2008.09.04
申请人
发明人
分类号
G01R1/067
主分类号
G01R1/067
代理机构
代理人
主权项
地址
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