发明名称 |
DISEASE DIAGNOSIS METHOD, MARKER SCREENING METHOD AND MARKER USING TOF-SIMS |
摘要 |
PURPOSE: A method for diagnosing diseases by Time-of-Flight Secondary Ion Mass Spectrometry(TOF-MS) is provided to prevent pain to a patient and to diagnose disease economically. CONSTITUTION: A disease is diagnosed using Time-of-Flight - Mass Spectrometry(TOF-MS) using secondary ion mass(m/z) peaks patterns of measured biological sample. The TOF-MS is time-of-flight secondary ion mass spectrosmetry(TOF-SIMS). The pattern is a pattern having secondary ion mass of 1-500 range. The pattern is the position of the secondary ion mass(m/z) peaks, intensity of the peaks, or combination thereof. A method for diagnosing disease is to compare normal pattern of healthy person or standard pattern of specific disease with test pattern from biological sample of a suspected patient. The biological sample is feces or feces liquid.
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申请公布号 |
KR20100086967(A) |
申请公布日期 |
2010.08.02 |
申请号 |
KR20100057408 |
申请日期 |
2010.06.17 |
申请人 |
KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE |
发明人 |
LEE, TAE GEOL;MOON, DAE WON;YOO, BYONG CHUL;KIM, IN HOO |
分类号 |
G01N33/50;G01N33/48;G01N33/574 |
主分类号 |
G01N33/50 |
代理机构 |
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