发明名称 DISEASE DIAGNOSIS METHOD, MARKER SCREENING METHOD AND MARKER USING TOF-SIMS
摘要 PURPOSE: A method for diagnosing diseases by Time-of-Flight Secondary Ion Mass Spectrometry(TOF-MS) is provided to prevent pain to a patient and to diagnose disease economically. CONSTITUTION: A disease is diagnosed using Time-of-Flight - Mass Spectrometry(TOF-MS) using secondary ion mass(m/z) peaks patterns of measured biological sample. The TOF-MS is time-of-flight secondary ion mass spectrosmetry(TOF-SIMS). The pattern is a pattern having secondary ion mass of 1-500 range. The pattern is the position of the secondary ion mass(m/z) peaks, intensity of the peaks, or combination thereof. A method for diagnosing disease is to compare normal pattern of healthy person or standard pattern of specific disease with test pattern from biological sample of a suspected patient. The biological sample is feces or feces liquid.
申请公布号 KR20100086967(A) 申请公布日期 2010.08.02
申请号 KR20100057408 申请日期 2010.06.17
申请人 KOREA RESEARCH INSTITUTE OF STANDARDS AND SCIENCE 发明人 LEE, TAE GEOL;MOON, DAE WON;YOO, BYONG CHUL;KIM, IN HOO
分类号 G01N33/50;G01N33/48;G01N33/574 主分类号 G01N33/50
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