SEMICONDUCTOR INTEGRATED CIRCUIT AND ELECTRONIC INFORMATION DEVICE

摘要

<P>PROBLEM TO BE SOLVED: To overcome the problem that an area is increased if a test circuit is inserted or a speed is degraded during a normal operation although several methods for troubleshooting in a control signal of a tristate gate are proposed in an existing technology. Ž<P>SOLUTION: A semiconductor integrated circuit and an electronic information device for reducing the area and troubleshooting in the control signal of the tristate gate without degrading the speed during the normal operation in comparison with a conventional technology are proposed by providing a troubleshooting auxiliary circuit using the tristate gate. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž