发明名称 |
PHOTOMASK BLANK, METHOD FOR ALIGNING PHOTOMASK, AND METHOD FOR MANUFACTURING DOUBLE-SIDED PHOTOMASK |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a photomask blank in which front and back faces are aligned with high accuracy. <P>SOLUTION: The photomask blanks has: a transparent substrate 100; an alignment mark 130 for aligning the front and the back faces, the mark formed as a concave on a first major face 110 of the transparent substrate 100; a light-shielding film layer 121 formed on a second major face 120 different from the first major face 110 of the transparent substrate 100; and a resist film layer 122 formed on the light-shielding film layer 121. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010164675(A) |
申请公布日期 |
2010.07.29 |
申请号 |
JP20090005465 |
申请日期 |
2009.01.14 |
申请人 |
DAINIPPON PRINTING CO LTD |
发明人 |
ITO KIMIO;HORIGUCHI RYUJI;SAKAMOTO KOJI;YOSHIDA KOJI;KURIHARA MASAAKI |
分类号 |
G03F1/38;G03F1/50;G03F1/68;H01L21/027 |
主分类号 |
G03F1/38 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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