| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method for diagnosing the inside of an insulated wire, capable of conveniently and surely detecting the occurrence of an oxide film in the internal element wire of an insulated wire, and to provide a device therefor. <P>SOLUTION: There are provided the method for diagnosing inside for examining the occurrence of the oxide film in the copper-made internal element of an insulated wire L includes steps of irradiating each reference wire and each object wire to be diagnosed with a determining far-infrared rays selected from among the frequencies in a rang of 1.3-2.3 THz and a calibrating far-infrared rays with a frequency of a predetermined difference from this range; comparing reflection strength thereof; and diagnosing the occurrence of the oxide film of the object to be diagnosed, and the device for diagnosing an inside for implementing the method. <P>COPYRIGHT: (C)2010,JPO&INPIT</p> |
