发明名称 INTERNAL VOLTAGE GENERATOR OF SEMICONDUCTOR MEMORY DEVICE
摘要 PURPOSE: An internal voltage generator of a semiconductor memory device is provided to reduce DC current consumption by reducing a driving current in a power down mode. CONSTITUTION: A comparison voltage generator(100) output a comparison voltage which is differentially amplified in response to the voltage of a first node which is determined according to a reference voltage and an internal power voltage. The comparison voltage generator receives a driving current through a third node. A bulk bias controller(260) selectively output different voltages as a bulk bias voltage in response to a control signal which is activated according to an operation mode. An internal voltage driving unit(200) controls a threshold voltage in response to the bulk bias voltage. The internal voltage driving unit outputs an internal power voltage to an output node in response to the comparison voltage.
申请公布号 KR20100085427(A) 申请公布日期 2010.07.29
申请号 KR20090004704 申请日期 2009.01.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, JUN PHYO
分类号 G11C5/14 主分类号 G11C5/14
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