发明名称 |
OHMIC ELECTRODE, SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING OHMIC ELECTRODE, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide an ohmic electrode, a semiconductor device, a method for manufacturing an ohmic electrode, and to provide a method for manufacturing a semiconductor device for forming an ohmic electrode having a low resistance on the back face (N atomic face) of an AlGaN layer. <P>SOLUTION: The ohmic electrode 16 is formed on a back face 12b of an AlGaN layer 11, which has a surface 13a and a back face 12b on the opposite side of the surface 13a and whose surface 13a is (0001) face and whose conductivity type is n type. The region of the ohmic electrode 16 brought into contact with the back face 12b contains W. A method for manufacturing the ohmic electrode 16 is such that the ohmic electrode 16, whose area brought into contact with the back face 12b contains at least one of W and Mo, is formed. <P>COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010166012(A) |
申请公布日期 |
2010.07.29 |
申请号 |
JP20090094649 |
申请日期 |
2009.04.09 |
申请人 |
SUMITOMO ELECTRIC IND LTD |
发明人 |
SUMIYOSHI KAZUHIDE;KIYAMA MAKOTO |
分类号 |
H01L21/28;H01L29/47;H01L29/78;H01L29/872;H01L33/32;H01L33/40;H01S5/042 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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