METHOD AND APPARTUS FOR ACCOUNTING FOR CHANGES IN TRANSISTOR CHARACTERISTICS
摘要
PURPOSE: A method and an apparatus for measuring the change of characteristics of a transistor by monitoring the current of the transistor are provided to control the threshold voltage of a transistor. CONSTITUTION: A comparator receives reference signals and feedback signals from a transistor and includes an output terminal. A bias voltage generator comprises an input terminal connected to the output terminal of the comparator and an output terminal connected to the transistor.
申请公布号
KR20100085807(A)
申请公布日期
2010.07.29
申请号
KR20090025992
申请日期
2009.03.26
申请人
SAMSUNG ELECTRONICS CO., LTD.
发明人
LEE, WOOG EUN;SONG, JEAN HO;KWON, YEONG KEUN;LEE, MIN CHEOL;KIM, KI WON;LEE, YOUNG WOOK