发明名称 INSPECTION SYSTEM AND INSPECTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To shorten a time required for lifetime inspection of a liquid crystal panel, and to enable inspection in a condition closer to reality. Ž<P>SOLUTION: An inspection system includes: an irradiation part 13 for irradiating light onto a liquid crystal panel P; a resistivity measuring part 11 for measuring a resistivity value of the liquid crystal panel P; a storage part 16 for storing a reference period required for change as much as a prescribed value of a resistivity value of a reference liquid crystal panel Pr, when irradiating the reference liquid crystal panel Pr having a reference lifetime with equivalent light to the light; and an operation part 18 for determining quality of the liquid crystal panel by comparing a first period required for change as much as a prescribed value of a resistivity value of the liquid crystal panel P with the reference period. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010164445(A) 申请公布日期 2010.07.29
申请号 JP20090007323 申请日期 2009.01.16
申请人 SEIKO EPSON CORP 发明人 ISOBE AKIRA
分类号 G01N27/04;G02F1/13 主分类号 G01N27/04
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