发明名称 SEMICONDUCTOR DEVICE, AND METHOD OF MANUFACTURING THE SAME
摘要 <P>PROBLEM TO BE SOLVED: To form a p-channel MIS (Metal Insulator Semiconductor) transistor having a metal gate and an n-channel MIS transistor having a metal gate by the small number of steps. Ž<P>SOLUTION: A semiconductor device includes a semiconductor substrate having a silicon layer, n-type active region and p-type active region defined in the semiconductor substrate, a first high dielectric constant gate insulating film formed above the n-type active region, having a dielectric constant higher than silicon oxide and containing Al on its surface, a second high dielectric constant insulating film formed above the p-type active region and having a dielectric constant higher than silicon oxide, and first gate electrode and second gate electrode respectively formed on the first and second high dielectric constant gate insulating films and formed by materials containing metals or metal compounds having work functions suited for the n-channel transistor. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010165823(A) 申请公布日期 2010.07.29
申请号 JP20090006411 申请日期 2009.01.15
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 KATAUE AKIRA
分类号 H01L21/8238;H01L21/28;H01L21/768;H01L27/092;H01L29/423;H01L29/49;H01L29/78 主分类号 H01L21/8238
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