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发明名称
Verfahren zur Bestimmung geometrischer Parameter eines Wafers und Verwendung des Verfahren bei der optischen Inspektion von Wafern
摘要
申请公布号
DE102007010223(B4)
申请公布日期
2010.07.29
申请号
DE200710010223
申请日期
2007.02.28
申请人
VISTEC SEMICONDUCTOR SYSTEMS GMBH
发明人
SCHENCK, RENE;FRIEDRICH, RALF;IFFLAND, THOMAS;SKIERA, DANIEL
分类号
G01B11/00;G01B21/10;G01N21/95;G03F7/20;G03F9/00;H01L21/68
主分类号
G01B11/00
代理机构
代理人
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