发明名称 SYSTEM AND METHODS OF USING TEST POINTS AND SIGNAL OVERRIDES IN REQUIREMENTS-BASED TEST GENERATION
摘要 An electronic system for test generation is disclosed. The system comprises a source code generator, a test generator, and a code and test equivalence indicator, each of which take functional requirements of a design model as input. The test generator generates test cases for a first test set and a second test set, where the first test set comprises a target source code without references to test points in the source code and the second test set comprises a test equivalent source code that references the test points of the source code. The code and test equivalency indicator generates test metrics for the first and second test sets and comparatively determines whether the target source code is functionally identical to the test equivalent source code based on an analysis of the test metrics and a comparison of the target and the test equivalent source codes.
申请公布号 US2010192128(A1) 申请公布日期 2010.07.29
申请号 US20090360743 申请日期 2009.01.27
申请人 HONEYWELL INTERNATIONAL INC. 发明人 SCHLOEGEL KIRK A.;BHATT DEVESH;HICKMAN STEVE;OGLESBY DAVID V.;PATODI MANISH;PERIVELA VENKATARAMAN;LABH RACHANA
分类号 G06F11/36 主分类号 G06F11/36
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