发明名称 CHAMFERING METHOD AND DEVICE
摘要 PROBLEM TO BE SOLVED: To provide chamfering method and device for realizing a highly accurate wafer chamfering width without being affected by dispersion of thickness and warpage of a wafer. SOLUTION: Chamfering is performed by calculating a relative position at each rotating angle of a grinding tool and the wafer W based on thickness and thickness direction position at each rotating angle at an end part of the wafer W, while adjusting a position with the grinding tool and the wafer W based on the relative position at a machining point. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010162661(A) 申请公布日期 2010.07.29
申请号 JP20090008051 申请日期 2009.01.16
申请人 TOKYO SEIMITSU CO LTD 发明人 SHIBAOKA SHINJI;KISHISHITA SHINICHI
分类号 B24B49/02;B24B9/00;B24B49/08;B24B49/10;B24B49/12 主分类号 B24B49/02
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