发明名称 |
CHAMFERING METHOD AND DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide chamfering method and device for realizing a highly accurate wafer chamfering width without being affected by dispersion of thickness and warpage of a wafer. SOLUTION: Chamfering is performed by calculating a relative position at each rotating angle of a grinding tool and the wafer W based on thickness and thickness direction position at each rotating angle at an end part of the wafer W, while adjusting a position with the grinding tool and the wafer W based on the relative position at a machining point. COPYRIGHT: (C)2010,JPO&INPIT |
申请公布号 |
JP2010162661(A) |
申请公布日期 |
2010.07.29 |
申请号 |
JP20090008051 |
申请日期 |
2009.01.16 |
申请人 |
TOKYO SEIMITSU CO LTD |
发明人 |
SHIBAOKA SHINJI;KISHISHITA SHINICHI |
分类号 |
B24B49/02;B24B9/00;B24B49/08;B24B49/10;B24B49/12 |
主分类号 |
B24B49/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|