发明名称 METHOD OF SELECTIVE OXYGEN IMPLANTATION TO DIELECTRICALLLY ISOLATE SEMICONDUCTOR DEVICES USING NO EXTRA MASKS
摘要 A method of fabricating integrated circuit structures utilizes selective oxygen implantation to dielectrically isolate semiconductor structures using no extra masks. Existing masks are utilized to introduce oxygen into bulk silicon with subsequent thermal oxide growth. Since the method uses bulk silicon, it is cheaper than silicon-on-insulator (SOI) techniques. It also results in bulk silicon that is latch-up immune.
申请公布号 US2010190316(A1) 申请公布日期 2010.07.29
申请号 US20100753636 申请日期 2010.04.02
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 O'CONNELL DENIS FINBARR;CONCANNON ANN MARGARET
分类号 H01L21/762 主分类号 H01L21/762
代理机构 代理人
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