发明名称 Lithographic projection apparatus and gas purging method
摘要 <p>A lithographic projection apparatus (1) includes a support (MT) configured to support a patterning device (MA), the patterning device configured to pattern the projection beam (PB) according to a desired pattern. The apparatus has a substrate table (WT) configured to hold a substrate (W), a projection system (PL) configured to project the patterned beam onto a target portion of the substrate. The apparatus also has a purge gas supply system (100) configured to provide a purge gas near a surface of a component of the lithographic projection apparatus. The purge gas supply system includes a purge gas mixture generator (120) configured to generate a purge gas mixture which includes at least one purging gas and moisture. The purge gas mixture generator has a moisturizer (150) configured to add the moisture to the purge gas and a purge gas mixture outlet (130) connected to the purge gas mixture generator configured to supply the purge gas mixture near the surface.</p>
申请公布号 EP2211233(A2) 申请公布日期 2010.07.28
申请号 EP20100162412 申请日期 2004.07.21
申请人 ENTEGRIS, INC. 发明人 PAREKH, BIPIN S;SPIEGELMAN, JEFFREY J;ZELLER, ROBERT S;HOLMES, RUSSELL J
分类号 G03F7/20;G02B27/00 主分类号 G03F7/20
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