发明名称 EXPOSURE MASK AND METHOD FOR FORMING SEMICONDUCTOR DEVICE BY USING THE SAME
摘要 A photo mask includes a dot pattern formed between a line pattern and an island pattern. Methods of making a semiconductor device employing such a photo mask improves yield and productivity of the device.
申请公布号 KR100972910(B1) 申请公布日期 2010.07.28
申请号 KR20070122952 申请日期 2007.11.29
申请人 发明人
分类号 H01L21/027 主分类号 H01L21/027
代理机构 代理人
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