PHASE PLATE FOR PHASE-CONTRAST ELECTRON MICROSCOPE, METHOD FOR MANUFACTURING THE SAME AND PHASE-CONTRAST ELECTRON MICROSCOPE,申请号EP20050814365-传众专利搜索

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发明名称	PHASE PLATE FOR PHASE-CONTRAST ELECTRON MICROSCOPE, METHOD FOR MANUFACTURING THE SAME AND PHASE-CONTRAST ELECTRON MICROSCOPE
摘要
申请公布号	EP1845551(A4)	申请公布日期	2010.07.28
申请号	EP20050814365	申请日期	2005.12.02
申请人	NAGAYAMA IP HOLDINGS, LLC	发明人	NAGAYAMA, KUNIAKI;DANEV, RADOSTIN
分类号	H01J37/26;H01J37/04;H01J37/295	主分类号	H01J37/26
代理机构		代理人
主权项
地址

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