| 摘要 |
FIELD: nanotechnologies. ^ SUBSTANCE: invention relates to procedure of spectroscopy of electronic paramagnet resonance (EPR) in research of nanostructures by EPR method. Method for determination of semiconductor nanoparticles dimensions includes preliminary building of calibration curve of dependence between value g of small donor EPR signal factor and size of nanoparticles, size of which is measured. Sample of semiconductor nanoparticles is placed into cryogenic system and cooled down to temperature of 1.5-4.0 K. Cooled semiconductor nanoparticles are exposed to microwave field with frequency v, equal to 90-100 GHz created by generator of microwave range and supplied to the first optical window through wave guide and megaphone. Sample of nanoparticles is exposed to permanent magnetic field B created by superconducting magnet corresponding to EPR of small donors at frequency v and determined from the following ratio: h=gB, where h - Planck constant, - Bohr magneton. Sample is also radiated by pulse ultraviolet radiation through system of mirrors with energy, which exceeds value of prohibited zone of sample semiconductor nanoparticles. On completion of sample nanoparticles radiation with ultraviolet radiation, EPR signal of small donors is registered. EPR signal of small donors registers photodetector device (PDD) by change in intensity of afterglow in semiconductor nanoparticles under conditions of small donors EPR. Signal from PDD is sent to unit of signals registration. G factor of small donors is measured, and size of nanoparticles is determined using specified calibration curve. Signal is registered along optical channel. ^ EFFECT: increased sensitivity of small donors EPR spectra registration in semiconductor nanocrystals. ^ 4 cl, 4 dwg |
