发明名称 High K dielectric growth on metal triflate or trifluoroacetate terminated III-V semiconductor surfaces
摘要 Surface preparation of a compound semiconductor surface, such as indium antimonide (InSb), with a triflating agent, such as triflic anhydride or a trifluoroacetylating agent, such as trifluoroacetic anhydride is described. In one embodiment, the triflating or trifluoroacetylating passivates the compound semiconductor surface by terminating the surface with triflate trifluoroacetate groups. In a further embodiment, a triflating agent or trifluoroacetylating agent is employed to first convert a thin native oxide present on a compound semiconductor surface to a soluble species. In another embodiment, the passivated compound semiconductor surface is activated in an ALD chamber by reacting the triflate or trifluoroacetate protecting groups with a protic source, such as water (H2O). Metalorganic precursors are then introduced in the ALD chamber to form a good quality interfacial layer, such as aluminum oxide (Al2O3), on the compound semiconductor surface.
申请公布号 US7763317(B2) 申请公布日期 2010.07.27
申请号 US20070694781 申请日期 2007.03.30
申请人 INTEL CORPORATION 发明人 BLACKWELL JAMES M.;RACHMADY WILLY;KEARNS GREGORY J.;MORRISON DARRYL J.
分类号 C23C16/00 主分类号 C23C16/00
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