发明名称 Semiconductor memory device having a short reset time
摘要 A semiconductor memory device includes a row path circuit, a reset signal generating circuit and a column path circuit. The row path circuit is initialized in response to a power-up signal. The reset signal generating circuit delays the power-up signal to generate a column reset signal. The column path circuit is initialized in response to the column reset signal. The semiconductor memory device can reduce a peak value of a surge current by initializing a row path circuit and a column path circuit at different time points. Therefore, the semiconductor memory device may have a relatively short setup time of an internal power supply voltage.
申请公布号 US7764562(B2) 申请公布日期 2010.07.27
申请号 US20080012244 申请日期 2008.02.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHEON KWUN-SOO;NA BYONG-WOOK
分类号 G11C7/00 主分类号 G11C7/00
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