发明名称 |
Failure diagnosis for logic circuits |
摘要 |
A failure diagnosing method of logic circuits includes generating failure candidate data for logic circuits based on failure diagnosis data obtained from the logic circuits by using a failure diagnosis tool; and inputting the failure candidate data for the logic circuits. A predetermined data is extracted from each of the failure candidate data for the logic circuits. Failures of the logic circuits are diagnosed by collecting a name of each of the failure candidate data from the predetermined data and the number of failure candidate data; and the collected data are outputted on a display unit.
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申请公布号 |
US7765444(B2) |
申请公布日期 |
2010.07.27 |
申请号 |
US20070934800 |
申请日期 |
2007.11.05 |
申请人 |
NEC ELECTRONICS CORPORATION |
发明人 |
NIKAIDO MASAFUMI;UKAI TOMOMI |
分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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