发明名称 ANIONIC ABRASIVE PARTICLES TREATED WITH POSITIVELY-CHARGED POLYELECTROLYTES FOR CMP
摘要 The invention provides chemical-mechanical polishing systems, and methods of polishing a substrate using the polishing systems, comprising an abrasiv, a liquid carrier, and a positively charged polyelectrolyte with a molecular weight of about 15,000 or more, wherein the abrasive comprises particles that are electrostatically associated with the positively charged polyelectrolyte.
申请公布号 KR20100084197(A) 申请公布日期 2010.07.23
申请号 KR20107014721 申请日期 2003.02.10
申请人 CABOT MICROELECTRONICS CORPORATION 发明人 CHERIAN ISAAC K.;CARTER PHILLIP W.;CHAMBERLAIN JEFFREY P.;MOEGGENBORG KEVIN J.;BOLDRIDGE DAVID W.
分类号 C09K3/14;B24B37/04;C09G1/02;H01L21/304 主分类号 C09K3/14
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