| 摘要 |
The invention relates to a full raster cartridge for a parallel tester for testing an unpopulated printed circuit board, a spring contact pin for such a full raster cartridge, and an adapter for a parallel tester for testing an unpopulated printed circuit board. According to a first aspect of the present invention, spring contact pins are fixed in the full raster cartridge by means of a film. According to a further aspect of the present invention, the full raster cartridge has two plates that are movable relative to each other in the axial direction of the spring contact pins and have a clearance transverse to the axial direction. According to a third aspect of the present invention, the spring contact pins are configured using a centric spring contact point. According to a further aspect of the present invention, an adapter has contact pins that are provided with a sensor head, wherein the contact pins have a locking projection, by which said contact pins are secured on a guide plate of the adapter to prevent said contact pins from falling out.
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