发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND FUSE ELEMENT FOR THE SAME
摘要 PROBLEM TO BE SOLVED: To suppress the occurrence of a failure wherein carrying out of disconnection by an electrical fuse results become insufficient. SOLUTION: A semiconductor integrated circuit includes a first wiring (2); a second wiring (3) disposed on the first wiring (2) through an interlayer film (6); and a fuse element (1) that penetrates the interlayer film (6) so as to connect the first and second wirings (2) and (3) and blocks connection between the first and second wirings (2) and (3), in response to a power supplied from the second wiring (3). A body portion (4) of the fuse element (1) includes a first side surface (14) and second side surface (15), corresponding to a position opposite to the first side surface (14). An angle of a surface, including the first side surface (14) to a lower side interface, is a first angle (θ1) larger than or equal to a right angle, and the angle of a surface that includes the second side surface (15) to the lower side interface is, preferably, a second angle (θ2) which is larger than the first angle (θ1). COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010161287(A) 申请公布日期 2010.07.22
申请号 JP20090003614 申请日期 2009.01.09
申请人 RENESAS ELECTRONICS CORP 发明人 IGUCHI MANABU
分类号 H01L21/82;H01L21/3205;H01L23/52 主分类号 H01L21/82
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