PROBE INSPECTION APPARATUS

摘要

PROBLEM TO BE SOLVED: To provide a probe inspection apparatus for implementing a conduction inspection of a connector which accepts a mount misalignment of the connector. SOLUTION: The probe inspection apparatus implements the conduction inspection of a rectangular/cubic connector 20 having a top surface on which two rows of linear contact terminals 21 are protruded and equally spaced in the longitudinal direction, and having a bottom surface soldered to a mount error margin board in the lateral direction. A length Lt of a bottom surface of a tip 30a of the probe contacting the contact terminal 21 in the lateral direction of the connector is set to a half-value length of a mount error margin Ma in the lateral direction of the connector. A length LWin the longitudinal direction of the connector is set to a multiple less than a half value of a dimension between centers of the contact terminals 21. A planar nonconductive adjacent pin short-circuit prevention plate 40 is provided, and has a plurality of openings for passing through the tip 30a and preventing a rotation of the tip. COPYRIGHT: (C)2010,JPO&INPIT