发明名称 X-RAY SPECTRAL INFORMATION ACQUISITION METHOD AND X-RAY SPECTROMETER
摘要 PROBLEM TO BE SOLVED: To provide an X-ray spectrometer capable of acquiring spectral diffraction of an X-ray in a wide wavelength range with excellent reproducibility, relative to the X-ray spectrometer. SOLUTION: This X-ray spectrometer includes: two spectroscopic elements 1, 2 arranged mutually approximately at an angle of about 90°, for receiving a characteristic X-ray 13 generated from a sample 11; a position sensitive detector 15 for receiving simultaneously each dispersed light from the two spectroscopic elements, and converting each light into electric signals; a memory for storing output from the position sensitive detector; an image processing part for reading out data stored in the memory, and performing prescribed image processing; and a display part for displaying spectral information by receiving output from the image processing part. COPYRIGHT: (C)2010,JPO&INPIT
申请公布号 JP2010160094(A) 申请公布日期 2010.07.22
申请号 JP20090003340 申请日期 2009.01.09
申请人 JEOL LTD 发明人 TSUKAMOTO KAZUNORI
分类号 G01N23/225;G01J3/36;G01N21/27;G21K1/06 主分类号 G01N23/225
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