发明名称 PROBE ASSEMBLY
摘要 <P>PROBLEM TO BE SOLVED: To arrange probes at a small pitch without reducing a slit pitch. Ž<P>SOLUTION: In this probe assembly, a plurality of probes including each belt-like mounting domain and each tip side needle tip domain extending further from the tip of the mounting domain are arranged in parallel on the lower side of a support so that a width direction of the mounting domain is a vertical direction. The plurality of probes include: a plurality of first probes whose each part of the needle tip domain is arranged on the tip side of the support, and which are received by each slit formed on a slit bar extending in the array direction of the probes, at intervals in the longitudinal direction of the slit bar; and second probes arranged respectively between adjacent first probes. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
申请公布号 JP2010160083(A) 申请公布日期 2010.07.22
申请号 JP20090003103 申请日期 2009.01.09
申请人 MICRONICS JAPAN CO LTD 发明人 HASEGAWA YOSHIE
分类号 G01R1/073;G01R31/00;G02F1/13 主分类号 G01R1/073
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