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发明名称
Layered Probes With Core
摘要
The present invention is a probe for testing an electrical device under test comprising a core layer that is highly conductive.
申请公布号
US2010182031(A1)
申请公布日期
2010.07.22
申请号
US20100703063
申请日期
2010.02.09
申请人
MICROPROBE, INC.
发明人
KISTER JANUARY
分类号
G01R31/02
主分类号
G01R31/02
代理机构
代理人
主权项
地址
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