发明名称 PROBE UNIT FOR INSPECTING DISPLAY PANEL
摘要 PURPOSE: A probe unit for display panel inspection which facilitates the exchange and repair of probes is provided to improve the simplicity, speediness and efficiency of work. CONSTITUTION: A first assembly(200) is installed in a main body and has a first probe. The first probes are touched with the electrode pads of the display panel. An electric signal is transferred. A second assembly(300) has second probes. The second probes are detachably installed in the main body in order not to put one upon another with second probe first probes. A pattern glass(400) is connected to a drive sheet equipped with a TAB IC(Tape Automated Bonding Integrated Circuit) and have a pattern terminal.
申请公布号 KR20100083087(A) 申请公布日期 2010.07.21
申请号 KR20090014134 申请日期 2009.02.20
申请人 DM&T CO., LTD. 发明人 SHIN, DONG WON;KIM, YEON HAE;LEE, DONG WON
分类号 G01R1/073;G02F1/13 主分类号 G01R1/073
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