发明名称 |
METHOD FOR EXAMINING A SAMPLE |
摘要 |
Disclosed is a method for examining a sample using a scanning tunneling microscope, wherein before or during image recording, a contrast agent is applied to at least one location on the tip of the scanning tunneling microscope and/or on the sample, which is part of the tunneling contact during the image recording, while a temperature less than or equal to the condensation temperature of the contrast agent is set at this location. A corresponding scanning tunneling microscope is disclosed. |
申请公布号 |
EP2208044(A2) |
申请公布日期 |
2010.07.21 |
申请号 |
EP20080850238 |
申请日期 |
2008.11.07 |
申请人 |
FORSCHUNGSZENTRUM JUELICH GMBH |
发明人 |
TEMIROV, RUSLAN;SUBACH, SERGEY;TAUTZ, FRANK, STEFAN |
分类号 |
G01Q30/10;G01Q30/12;G01Q60/10 |
主分类号 |
G01Q30/10 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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