发明名称 ENHANCING SPEED OF SIMULATION OF AN IC DESIGN WHILE TESTING SCAN CIRCUITRY
摘要 <p>A computer is programmed to prepare a computer program for simulating operation of an integrated circuit (IC) chip, in order to test scan circuitry therein. The computer is programmed to trace a path through combinational logic in a design of the IC chip, starting from an output port of a first scan cell and ending in an input port of a second scan cell. If the first and second scan cells receive a common scan enable signal, then the computer generates at least a portion of the computer program, i.e. software to perform simulation of propagating a signal through the path conditionally, for example when the common scan enable signal is inactive and alternatively to skip performing simulation when the common scan enable signal is active. The computer stores the portion of the computer program in memory, for use with other such portions of the computer program.</p>
申请公布号 EP2208078(A1) 申请公布日期 2010.07.21
申请号 EP20080782101 申请日期 2008.07.18
申请人 SYNOPSYS, INC. 发明人 PANDEY, YOGESH;SANKAR, VIJAY;JAIN, MANISH
分类号 G01R31/28;G06F11/267 主分类号 G01R31/28
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