发明名称 Stressor for engineered strain on channel
摘要 A semiconductor substrate having recesses filled with heteroepitaxial silicon-containing material with different portions having different impurity concentrations. Strained layers can fill recessed source/drain regions in a graded, bottom-up fashion. Layers can also line recess sidewalls with one concentration of strain-inducing impurity and fill the remainder to the recess with a lower concentration of the impurity. In the latter case, the sidewall liner can be tapered.
申请公布号 US7759199(B2) 申请公布日期 2010.07.20
申请号 US20070858054 申请日期 2007.09.19
申请人 ASM AMERICA, INC. 发明人 THOMAS SHAWN;TOMASINI PIERRE
分类号 H01L21/336 主分类号 H01L21/336
代理机构 代理人
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