发明名称 |
Test and diagnosis of semiconductors |
摘要 |
A method and system for performing diagnosing in an automatic test environment. The method begins by determining a fail condition during a test of a device under test (DUT). A diagnostic suite is determined for testing the fail condition. The diagnostic suite is generated if the diagnostic suite is not available for access.
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申请公布号 |
US7761751(B1) |
申请公布日期 |
2010.07.20 |
申请号 |
US20070708824 |
申请日期 |
2007.02.20 |
申请人 |
CREDENCE SYSTEMS CORPORATION |
发明人 |
WEST BURNELL G. |
分类号 |
G06F11/00;G01R31/28;G06F17/50 |
主分类号 |
G06F11/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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