发明名称 Semiconductor device design method, semiconductor device design system, and computer program for extracting parasitic parameters
摘要 A design method of a semiconductor device is provided with a mask region setting step of setting a mask region to a layout of the semiconductor device, a parasitic parameter changing step of setting parasitic parameters of a wiring part within the mask region to zero, and a parasitic parameter extraction step of extracting parasitic parameters of either the total layout or a specific part of the layout. The parasitic parameter changing step includes a virtual wiring layer generation step of generating a virtual wiring layer corresponding to the actual wiring layer of the semiconductor device, a parasitic parameter definition step of defining the parasitic parameters of the virtual wiring layer as zero, and a wiring layer conversion step of converting the wiring part within the mask region of the wiring of the actual wiring layer, to the wiring part of the virtual wiring layer.
申请公布号 US7761835(B2) 申请公布日期 2010.07.20
申请号 US20070953184 申请日期 2007.12.10
申请人 ELPIDA MEMORY, INC. 发明人 KITANO TOMOHIRO;NAGAMINE HISAYUKI
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
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