发明名称 Surface inspection method and surface inspection apparatus
摘要 When detecting light scattered by an object to be inspected by using a pulse laser as a light source, noise increases unless a sampling repletion period of an A/D converter is determined so as to be related to a pulse oscillation repetition period of the light source. (1) The sampling repletion period of the A/D converter is set equal to the pulse oscillation repetition period of the light source or an integer times thereof, and the sampling is synchronized with oscillation of the light source. Or (2) the sampling repletion period of the A/D converter is set equal to a half-integer times the pulse oscillation repetition period of the light source. Even if a ripple component resulting from emission pulses of the light source remains in the scattered light signal supplied to the A/D converter remains, therefore, its influence can be eliminated or reduced.
申请公布号 US7761246(B2) 申请公布日期 2010.07.20
申请号 US20090349206 申请日期 2009.01.06
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 MATSUI SHIGERU
分类号 G01N21/88 主分类号 G01N21/88
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