| 摘要 |
There is provided a test apparatus for testing a device-under-test, having a reference clock source for generating reference clock for controlling operations of the device-under-test, a clock regenerating circuit for generating, based on a phase adjusting signal to be inputted, regenerated clock whose frequency is almost equal with the reference clock and having a phase difference from the reference clock corresponding to the phase adjusting signal, a timing comparator for obtaining a value of an output signal outputted from the device-under-test based on the regenerated clock, a first phase comparing section for outputting the phase adjusting signal that converges the phase difference into a reference phase difference set in advance to the clock regenerating circuit based on the comparison result of the phases of the output signal and the regenerated clock and a storage section for sequentially storing the phase adjusting signals outputted from the first phase comparing section.
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